LQFP Series Appearance Inspection Equipment

  • Bad pin display
  • Plastic body bad display
  • Notch reverse bad display
  • Bad character display

TO220 Series Appearance Inspection Equipment

  • 散热片不良展示
  • 管脚不良展示
  • 塑封体不良展示
  • 管脚检测结果

DIP series appearance inspection equipment

Typical defect description (pin)

Pin size defect detection diagram

CodeBad NameActual bad diagram
aPin spacing
  • case-three_pic5case-three_pic4

  • Characterization:Through the structured light and the lens with optical prism, the perfect imaging of the front and two sides of the chip is achieved. In turn, the key dimensions are acquired one by one through a stable algorithm. The detection of each dimension of the chip is realized.

bTop surface of the device to the middle of the coarse pin size
cFine stitch length
dPin span distance
ePin tilt angle
fCoarse stitch width
gFine stitch width
hComponent thickness
Typical defective description (printing & plastic sealing)
Test TypeEach detection of bad items
Detection of geometric dimensionsPrint position, print angle, print margin, character offset
  • bad-two_pic

    good products

  • bad-two_pic2

    Print Offset

  • bad-two_pic3

    Character Offset

  • bad-two_pic4

    Contrast Ratio

  • bad-two_pic5

    Over/Under Hitting

Inspection of print qualityContrast, underprint, overprint, overall size

Appearance defect detection - Printing defect

Appearance defect detection - typical defects of plastic seal and pins

DIP series appearance inspection equipment

Suzhou Fuxinlin Photoelectric Technology Co. 18761900800(Mr. Xu)

Address: 5F, Building 16, Suzhou Nano City, No.99 Jinjihu Avenue, Suzhou Industrial Park, Jiangsu Province

Scan to follow

Copyright@2021Suzhou Fuxinlin Optoelectronic Technology Co., LTD.Su ICP No. 19045930-1
Technical support:WH88